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Spectral encoding based measurement of ultrafast x-ray arrival and shape characterization

Mina Bionta (LCAR)

Abstract:
Single-shot measurement of the relative delay between x-ray free
electron laser (FEL) pulses and optical laser pulses has now been
improved to 10 fs rms error and has successfully been demonstrated
for both soft and hard x-ray pulses (500 - 9600 eV). It is based on
x-ray induced step-like reduction in optical transmissivity of a
semiconductor membrane (Si3N4). The transmissivity is probed by an
optical continuum spanning 450 - 650 nm where spectral chirp provides
a mapping of the step in spectrum to the arrival time of the x-ray
pulse relative to the optical laser system. Various other materials
are also investigated demonstrating a unique optical modulation for
each.

Affiliation:
The Linac Coherent Light Source, SLAC National Accelerator Laboratory,
Menlo Park, CA, USA